Time‐resolved XAFS measurement using quick‐scanning techniques at BSRF |
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Authors: | Shengqi Chu Lirong Zheng Pengfei An Hui Gong Tiandou Hu Yaning Xie Jing Zhang |
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Affiliation: | 1. Multi-Discipline Research Center, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing100049, People's Republic of China;2. Department of Engineering Physics, Tsinghua University, Beijing100084, People's Republic of China |
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Abstract: | A new quick‐scanning X‐ray absorption fine‐structure (QXAFS) system has been established on beamline 1W1B at the Beijing Synchrotron Radiation Facility. As an independent device, the QXAFS system can be employed by other beamlines equipped with a double‐crystal monochromator to carry out quick energy scans and data acquisition. Both continuous‐scan and trapezoidal‐scan modes are available in this system to satisfy the time scale from subsecond (in the X‐ray absorption near‐edge structure region) to 1 min. Here, the trapezoidal‐scan method is presented as being complementary to the continuous‐scan method, in order to maintain high energy resolution and good signal‐to‐noise ratio. The system is demonstrated to be very reliable and has been combined with in situ cells to carry out time‐resolved XAFS studies. |
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Keywords: | time‐resolved XAFS QXAFS 1W1B BSRF |
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