首页 | 本学科首页   官方微博 | 高级检索  
     

Studies of Spectroscopic Ellipsometry in Cd1-xMnxTe/CdTe Superlattices
引用本文:陈辰嘉 王学忠 Vittorio BELLANI Angiolino STELLA. Studies of Spectroscopic Ellipsometry in Cd1-xMnxTe/CdTe Superlattices[J]. 中国物理快报, 2006, 23(1): 207-210
作者姓名:陈辰嘉 王学忠 Vittorio BELLANI Angiolino STELLA
作者单位:[1]School of Physics, Peking University, Beijing 100871 [2]Consorzio Nazionale Interuniversitario per le Scienze Fisiche della Materia (CNISM) and Dipartimento di Fisica "A. Volta", Universita degli Studi di Pavia, 27100 Pavia, Italy
摘    要:Cd1-xMnxTe/CdTe superlattices and thin films were grown by molecular beam epitaxy on GaAs (001) substrates. Spectroscopic ellipsometry measurements were performed on Cd1-x Mnx Te/ CdTe superlattices with compositions x = 0.4, 0.8, and Cd1-xMnx Te thin films with x = 0.2, 0.4, 0.6 at room temperature in the photon energy range 1.4-5 eV. In superlattices the pseudodielectric functions measured by ellipsometry show specific features related to the exciton transition between quantized interbands. The exciton transitions related to the heavy holes of 11 H, 22H, and 33H are observed and identified. In thin films spectroscopic ellipsometry allows the clear identification of the energy gap Eo. Additionally, critical point transitions are observable in both the spectra of the superlattices and films. Photoreflectance spectra were also performed at room temperature in order to compare with our ellipsometry results. After taking into account the strain-induced and quantum confinement effects, the theoretical calculations are in good agreement with our experimental spectra. Ellipsometry appears to be a suited technique to monitor the MBE growth, ultimately also in situ, of diluted magnetic low-dimensional systems.

关 键 词:椭圆偏光法 超晶格 薄膜 分子束 GaAs衬底
收稿时间:2005-08-30
修稿时间:2005-08-30

Studies of Spectroscopic Ellipsometry in Cd1-xMnxTe/CdTe Superlattices
CHEN Chen-Jia, WANG Xue-Zhong. Studies of Spectroscopic Ellipsometry in Cd1-xMnxTe/CdTe Superlattices[J]. Chinese Physics Letters, 2006, 23(1): 207-210
Authors:CHEN Chen-Jia   WANG Xue-Zhong
Abstract:
Keywords:
本文献已被 维普 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号