Buckling of a stiff thin film on a compliant substrate in large deformation |
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| Authors: | J. Song H. Jiang Z.J. Liu D.Y. Khang Y. Huang J.A. Rogers C. Lu C.G. Koh |
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| Affiliation: | 1. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA;2. Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ 85287, USA;3. Institute of High Performance Computing, 1 Science Park Road, #01-01 The Capricorn, Singapore Science Park II, Singapore 117528, Singapore;4. Department of Materials Science and Engineering, Beckman Institute, and Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA;5. Department of Civil and Environmental Engineering and Department of Mechanical Engineering, Northwestern University, Evanston, IL 60208, USA;6. Department of Civil Engineering, National University of Singapore, 1 Engineering Drive 2, E1A 07-03, Singapore 117576, Singapore |
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| Abstract: | A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically. |
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