Characterisation of anodic oxide films on zirconium formed in sulphuric acid: XPS and corrosion resistance investigations

Present work describes investigations of a two-step process consisting of galvanostatic anodising in a 1 M H₂SO₄ solution at 100 mA cm⁻² up to the limiting voltages of 20, 60, 80, 100 and 120 V, directly after which potentiostatic regime was employed and the current was allowed to drop. The total treatment time (5 min) was held constant for all samples. The treatment was carried out to improve the corrosion resistance of zirconium in physiological conditions, which was determined by electrochemical evaluation in Ringer’s solution. XPS studies revealed that after anodising sulphur was incorporated into the oxide film in the form of sulphated zirconia. The maximum content of sulphate in the oxide layer was observed after anodising at 80 V. Anodising at higher voltages resulted in formation of coatings with decreasing amount of sulphur. It was found that there is a strong correlation between the sulphur content in the oxide layers and the measured corrosion current density. On the other hand, the pitting corrosion resistance seemed to be unaffected by the presence of S and it was improving with the increasing limiting voltage of the treatment.