Metal‐conducting polymer interface studied by Kelvin probe microscopy: Au and Al on poly(3‐octyl‐thiophene) |
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| Authors: | Jose Abad Jaime Colchero |
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| Institution: | 1. Departamento de Física Aplicada, Universidad Politécnica de Cartagena, , E‐30202 Cartagena, Spain;2. Departamento Física, Facultad de Química (Campus Espinardo), Instituto Univeristario de Investigación en óptica y Nanofísica, Universidad de Murcia, , E‐30100 Murcia, Spain |
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| Abstract: | In this work, we report a Kelvin probe microscopy investigation on the structural and electronic properties of gold and aluminum thin films evaporated on poly(3‐octyl‐thiophene) films. Our experimental setup allows us to perform scanning force microscopy (SFM) studies of the same area even if the sample is taken out of the SFM system for different processes (Au and Al evaporation). This allows a detailed study of the effect of adsorbed metal particles on the morphology and electrical properties of polymer thin films at the nanoscale. We found different behavior for both metals in morphology and electrical properties at the interface. These results can contribute to explain what happens at the metal–polymer interface of the devices when the metal contacts are grown. Thereby the observed nanoscale structural changes can be correlated with the overall performance of the fabricated devices. © 2014 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2014 , 52, 1083–1093 |
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| Keywords: | aluminum atomic force microscopy (AFM) conducting polymers gold interfaces Kelvin probe microscopy metal polymer interface P3OT thin films |
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