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High Resolution Tip Enhanced Raman Mapping on Polymer Thin Films |
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| Authors: | L Xue W Li G G Hoffmann J G P Goossens J Loos G de With |
| Institution: | 1. Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands;2. Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands
Dutch Polymer Institute, P.O. Box 902, 5600 AX Eindhoven, The Netherlands;3. Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands Dutch Polymer Institute, P.O. Box 902, 5600 AX Eindhoven, The Netherlands Presently at the Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, Scotland, United Kingdom |
| Abstract: | Advanced tip enhanced Raman mapping (TERM) was applied to high resolution chemical identification on nanoscale. Thin poly(methyl methacrylate)/poly(styrene acrylonitrile) (SAN28/PMMA) blend films were measured at different stages of phase separation. New insights into the phase evolution behavior of the thin films were obtained, when the TERM images were compared. An unexpected morphology transition was observed after a few minutes annealing at 250 °C. No surface enrichment of PMMA was observed, differing from the previous reports on a similar well-studied system of SAN33/PMMA. The glass transition temperature, the surface and interfacial tension were found to be the main factors responsible for the phase evolution behavior of SAN28/PMMA films. |
| Keywords: | high resolution chemical identification phase separation polymer blend thin film tip enhanced Raman spectroscopy (TERS) tip enhanced Raman mapping (TERM) |