Molecular and lamellar orientation in polyethylene thin films

Summary A combined wide (WA) and small angle X-ray diffraction (SAXS) study of melt compressed low density PE samples into the form of very thin films is reported. The WAXD patterns show an uniaxialb axis orientation normal to the film surface which can be interpreted in terms of a row structure in the plane of the film. The analysis of SAXS data indicates, in addition, a preferential orientation of bundles of stacked lamellae parallel to the film surface separated by longitudinal microvoids.With 3 figures