In-situ surface-enhanced Raman scattering and FT-Raman spectroscopy of black prints |
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| Institution: | 1. Slovak University of Technology in Bratislava, Faculty of Chemical and Food Technology, Radlinskeho 9, 812 37 Bratislava, Slovak Republic;2. Slovak Academy of Sciences, Institute of Chemistry, Dubravska cesta 9, 845 38 Bratislava, Slovak Republic;3. Leopold-Franzens University, Institute of Analytical Chemistry and Radiochemistry, CCB ? Center for Chemistry and Biomedicine, Innrain 80/82, 6020 Innsbruck, Austria;1. Key Lab of Process Analysis and Control of Sichuan Universities, Yibin University, Yibin, Sichuan, 644000, China;2. Hospital, Yibin University, Yibin, Sichuan, 644000, China;1. Faculdade de Educação Ciências e Letras do Sertão Central, Universidade Estadual do Ceará Quixadá, CE 63.900-000, Brazil;2. Deparamento de Física, Universidade Federal do Ceará, Fortaleza, CE 60455-760, Brazil;3. Instituto de Ciências Exatas, Universidade Federal do Sul e Sudeste do Pará, CEP 68.505-080 Marabá, PA, Brazil;4. Universidade Federal do Cariri, 63000-000 Juazeiro do Norte, CE, Brazil;1. Suzhou Institute of Supervision and Inspection on Product Quality, Suzhou 215104, China;2. State Key Laboratory of Food Science and Technology, School of Food Science and Technology, Jiangnan University, 1800 Lihu Avenue, Wuxi, Jiangsu 214122, China;1. Department of Chemistry, Institute for Molecular Science and Fusion Technology, Kangwon National University, Chunchon 24341, South Korea;2. Key Laboratory of Preparation and Applications of Environmental Friendly Materials (Jilin Normal University), Ministry of Education, Changchun 130103, PR China;3. Korea Research Institute of Ships & Ocean Engineering (KRISO), Goseong 24747, South Korea;4. State Key Laboratory of Supramolecular Structure and Materials, Jilin University, Changchun 130012, PR China;1. School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, 230009, China;2. Beijing Engineering Research Center of Optoelectronic Information and Instrument, Beijing Key Laboratory of Optoelectronics Measurement Technology, Beijing Information Science and Technology University, Beijing, 100192, China |
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| Abstract: | The black inkjet and laser prints were analysed with regard to application in forensic analysis of questioned documents. The purpose of this work was to study spectral properties and compare the suitability of surface-enhanced Raman scattering (SERS) with Fourier transform Raman spectra of prints. This work aimed to find optimal surface-enhanced Raman spectroscopic approach for the future analysis of documents using statistical methods. In this work, we analysed eight prints of four laser and four inkjet devices. The samples were measured using two dispersive Raman devices; (DXR Raman microscope with excitation line 532 nm, Foram 685-2 spectrometer ? 685 nm) and FT-Raman device (Bruker Spectrometer MultiRAM with excitation line 1064 nm). The silver nanoparticles (AgNPs) colloid for SERS experiment were synthesised and checked by UV–vis spectroscopy and scanning electron microscopy (SEM). The remarkable differences caused by centrifugation of silver colloid were observed just in the SEM images. The main contribution of this paper is to propose the novel approach achieving sufficient SERS signal intensity of black prints using the both, laser and inkjet printers. Moreover, this method is based on just a single metal colloid, and the analysis can be performed in-situ, i.e. directly on the printed sample surface. We consider the SERS could by highly promising and universal for applications in the forensic analysis of printed documents with the combination of statistical method when conventional methods are not effective. |
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| Keywords: | Surface-enhanced Raman scattering FT-Raman spectroscopy Document analysis |
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