X射线荧光光谱法测定氧化铝中杂质元素

应用X-射线荧光光谱法测定了氧化铝中11种杂质成分（SiO2，Fe2O3，Na2O，K2O，CaO，TiO2，P2O5，ZnO，V2O5，Ga2O3，Cr2O3）。试样用四硼酸锂和偏硼酸锂作混合熔剂融熔制成玻璃状片形熔块。通过在高纯氧化铝中加入一定量的上述11种元素的纯氧化物配制成中间标准样品，并用此中间标准样品和纯氧化铝作为空白试样组成高、低标，制备了校正曲线。又用此中间标准样品与纯氧化铝按一定比例配制控制样品对分析过程进行质量控制。对所提出方法的精密度进行了考核，结果表明以上11种杂质成分测定结果的RSD值均小于10％。用4种标样对此方法的准确度进行验证，结果表明所得测定值与已知值之间的误差均符合标准规定。

XRFS DETERMINATION OF IMPURITIES IN ALUMINUM OXIDE

X-ray fluorescence spectrometry was applied to the determination of 11 oxides, SiO2, Fe2O3, Na2O, K2O, CaO, TiO2, P2O5, ZnO, V2O5, Ga2O3 and Cr2O3 present as impurities in aluminum oxide. Glassy discs of sample was prepared by fusion with a mixed flux of lithium tetraborate and metaborate. An intermediate standard sample was prepared by mixing definite amounts of pure oxides of the 11 elements mentioned above with high-purity alumina. Calibration curve was prepared by the two-point method by using the intermediate standard sample and the high-purlty alumina as a blank sample. A control standard was also prepared by mixing the intermediate standard sample and pure alumina in a definite proportion. The precision of the present method was tested and values of RSDrs for all the oxides determined were less than 10%. In the analysis of 4 standard samples to test for the accuracy of this method, all the results obtained were in consistency with the known values.