Composition and Structure of Anodic Oxide Films on Titanium–Aluminum Alloys by Fast Electron Reflection Diffraction, Rutherford Backscattering, and Secondary Neutral Particle Mass Spectrometry |
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| Authors: | A N Kamkin L A Fishgoit A D Davydov |
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| Institution: | (1) Moscow State University, Vorob'evy gory 1, Moscow, 119899, Russia;(2) Frumkin Institute of Electrochemistry, Russian Academy of Sciences, Leninskii pr. 31, Moscow, 119071, Russia |
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| Abstract: | Anodic oxide films on some Ti–Al alloys are studied using fast-electron reflection diffraction, Rutherford backscattering, and secondary neutral-particle mass spectrometry. The films are amorphous, with a small amount of crystalline phases, and comprise a mixture of TiO2 and Al2O3. The Ti/Al ratio in an anodic film corresponds to that in the alloy matrix. Constants of anodic oxidation of the alloys are determined. |
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