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Reduction mechanisms of different oxidizing agents at diamond surfaces
Authors:Gaëlle Charrier  Arnaud Etcheberry  Nathalie Simon
Institution:UMR 8180, université de Versailles Saint-Quentin-en-Yvelines, institut Lavoisier de Versailles, 45, avenue des États-Unis, 78000 Versailles, France
Abstract:“Electroless” oxidation, at room temperature, of boron-doped diamond (BDD) films with oxidizing agents as Ce4+, MnO4?, H2O2 or S2O82? is an efficient way to transform hydrogen terminations (C-H) into oxygen ones (C-O). To investigate the oxidation mechanism of diamond surfaces through these open current potential (OCP) processes, we study in the present work the reduction mechanisms of the different oxidizing agents at BDD surfaces. Current-voltage measurements were performed using a rotating disk electrode of diamond immersed in a solution containing one of the species. Two different mechanisms were evidenced: an electrochemical for Ce4+ and MnO4? and a chemical one based on the production of radicals under light exposure for H2O2 and S2O82?.
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