| 聚甲基丙烯酸甲酯/苯乙烯-丙烯腈无规共聚物薄膜表面原位原子力显微镜相图 |
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| 引用本文： | 陶荟春,张双双,张晶莹,艾淑平,由吉春.聚甲基丙烯酸甲酯/苯乙烯-丙烯腈无规共聚物薄膜表面原位原子力显微镜相图[J].应用化学,2014,31(1):29-32. |
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| 作者姓名： | 陶荟春 张双双 张晶莹 艾淑平 由吉春 |
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| 作者单位： | (1.吉林建筑大学基础科学部 长春 130118;2.杭州师范大学材料与化学化工学院 杭州 310036) |
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| 基金项目： | 国家自然科学基金（21074029;21104013;21104014）和浙江省杰出青年基金（R4110021）资助项目 |
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| 摘 要： | 采用原位原子力显微镜在线跟踪方法,研究了聚甲基丙烯酸甲酯/苯乙烯-丙烯腈无规共聚物共混体系表面相分离行为,得到了具有下临界共溶温度(临界温度约为175℃)原位相图。与文献报道的用离位方法所得结果的主要差别是原位的临界相分离温度稍有提高,以及离位结果中存在的组成对称性。这些差别主要来源于离位和原位实验方法上的差别,薄膜厚度减小导致的相容性,热力学历史的变化以及基底效应的加剧。
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| 关 键 词： | 共混 相分离 原位 原子力显微镜 |
| 收稿时间： | 2013-03-12 |
| 修稿时间： | 2013-05-27 |
In-situ Atomic Force Microscopy Study on Phase Diagram ofPoly(methyl methacrylate)/Poly(styrene-co-acrylonitrile)Blend Films Surface |
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| TAO Huichun,ZHANG Shuangshuang,ZHANG Jingying,AI Shuping,YOU Jichun.In-situ Atomic Force Microscopy Study on Phase Diagram ofPoly(methyl methacrylate)/Poly(styrene-co-acrylonitrile)Blend Films Surface[J].Chinese Journal of Applied Chemistry,2014,31(1):29-32. |
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| Authors: | TAO Huichun ZHANG Shuangshuang ZHANG Jingying AI Shuping YOU Jichun |
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| Institution: | (1.Department of Basic Science,Jilin Jianzhu University,Changchun 130118,China;
2.College of Material,Chemistry and Chemical Engineering,Hangzhou Normal University,Hangzhou 310036,China) |
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| Abstract: | The phase diagram of surface phase separation in poly(methyl methacrylate)/poly(styrene-co-acrylonitrile)(PMMA/SAN) blend film with thickness of 130 nm was obtained by in-situ atomic force microscopy(AFM). The results show that the blend film has a lower critical system temperature(LCST) compared with the reported ex-situ phase diagram. The critical phase separation temperature was found to increase and the observed composition symmetry in ex-situ phase diagram was no longer existed. The difference between in-situ and ex-situ results can be ascribed to the thinner thickness of the film, different heat history and stronger substrate effect. |
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| Keywords: | polymer blend phase separation in-situ atomic force microscopy |
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