首页 | 本学科首页   官方微博 | 高级检索  
     检索      

TiO2颗粒在羟基表面的沉积行为及图案化
引用本文:梁 山,孙冬兰,薛群基.TiO2颗粒在羟基表面的沉积行为及图案化[J].无机化学学报,2011,27(1):135-140.
作者姓名:梁 山  孙冬兰  薛群基
作者单位:1. 天津科技大学理学院,天津,300457
2. 中国科学院兰州化学物理研究所固体润滑国家重点实验室,兰州,730000
基金项目:教育部留学回国人员科研启动基金,天津科技大学引进人才科研启动基金
摘    要:比较了3种具有羟基表面SiO2层的差异:紫外光照SAMs形成的羟基表面,紫外光照射前、照射后的羟基表面;用光照前后表面的差异,结合化学浴沉积技术在单晶硅基底上制得了TiO2微图案薄膜。系统考察了光源、硅片表面性质的变化、溶液等方面对图案生成的影响。实验表明TiO2沉积在未照区,电子和空穴动力学上的差异造成光照区表面正电荷增多,抑制了TiO2的沉积。该方法不需要光刻胶和自组装膜作为辅助模板,具有简单廉价的特点。

关 键 词:图案化  光照  电子  空穴  迁移率

Deposition Behavior and Patterning of TiO2 Particles on Hydroxyl Surfaces
LIANG Shan,SUN Dong-Lan and XUE Qun-Ji.Deposition Behavior and Patterning of TiO2 Particles on Hydroxyl Surfaces[J].Chinese Journal of Inorganic Chemistry,2011,27(1):135-140.
Authors:LIANG Shan  SUN Dong-Lan and XUE Qun-Ji
Institution:College of Science, Tianjin University of Science and Technology, Tianjin 300457, China,College of Science, Tianjin University of Science and Technology, Tianjin 300457, China and State Key Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Science, Lanzhou 730000, China
Abstract:Three kinds of hydroxyl surfaces on SiO2 layer are compared. The hydroxyl surfaces are formed by exposing the SAMs or the bare Si under UV light, and treating the bare Si surfaces only in piranha solution but not under UV light. Patterned TiO2 thin films were fabricated on the Si substrates with the methods of UV irradiation and chemical bath deposition. The reasons for patterns formation were discussed in the view of the UV light, modifications of Si wafer and the aqueous solution. It was found that TiO2 particles deposited onto the unirradiated regions. Different trapping/detrapping dynamics of the electrons and holes cause the holes to accumulate at SiO2 surface in the irradiated regions, and restrain the deposition of TiO2. The photoresist or self-assembled monolayers is needless in the process of patterning, so it is a simple and low-cost method.
Keywords:patterned  irradiation  electron  hole  mobility
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《无机化学学报》浏览原始摘要信息
点击此处可从《无机化学学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号