人造金刚石晶体缺陷的同步辐射X射线衍射形貌像浅析

利用同步辐射X射线对人造金刚石晶体缺陷进行了形貌学研究,实验采用了透射(劳埃)形貌术和反射形貌术两种方法.所得的X射线透射劳埃图上大部分斑点分别分布在四条主晶带上,经分析发现,该金刚石晶体主要的晶体缺陷为位错,并推导出晶体内部存在Frank不全位错.该晶体的反射形貌像中位错呈网状分布,说明其表层缺陷多于内部缺陷.此外,由形貌像分析发现该人造金刚石晶体的晶体缺陷明显少于天然金刚石.

Study on Crystal Defects in Synthetic Diamond with Synchrotron Radiation X-ray Diffraction Topography

Crystal defects in a synthetic diamond were studied by synchrotron radiation X-ray diffraction topography,including projection(Laue)and surface reflection topographies. Most of those diffraction spots on the Laue X-ray pattern of the synthetic diamond are distributed on four main crystal zones respectively. The main type of crystal defects in this sample are dislocations, and some of them belong to the Frank type. It shows that dislocations in the surface reflection topography distribute in a networks, which can reveal faults in the surface more than that inside. Further more, by analyzing and comparing the topographs it derives that the amount of the crystal defects in the synthetic diamond are obviously less than those in the natural diamond.