An accurate model for the thin film flow |
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Authors: | Hamid Ait Abderahmane Georgios H Vatistas |
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Institution: | (1) Department of Mechanical and Industrial Engineering, Concordia University, 1455 de Maisonneuve Blvd, West Montreal, QC, H3G 1M8, Canada |
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Abstract: | This paper deals with the linear stability of a liquid film flowing down an inclined plane. The Navier–Stokes equations were
reduced into four evolution equations that describe the development of the film depth, the flow rate, the free surface velocity,
and the wall shear stress, using the Karman–Polhausen boundary layer integral method. Thus, we were able to determine the
stability threshold and approach well the critical wave number for long waves. The obtained results were found to be in good
agreement with the experiments of Liu et al. |
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Keywords: | Liquid film Linear stability Flow model |
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