Error assessment using equidensity fringes in photoelasticity |
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Authors: | Günter Freidrich |
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Institution: | 1. Siemens A.G., Steinhauser Str. 50, 8000, München 80, Federal Republic of Germany
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Abstract: | This paper assesses the error when equidensity techniques are applied to photoelasticity. The basis is the common-exposure technique with scattered light. The error is investigated by using the recently developed equidensity film. The results show that the exposure technique is best possible if light and shadow are about equal on the exposed negative. In that case, an error interval is quantified. |
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