Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation |
| |
Authors: | T A Berfield J K Patel R G Shimmin P V Braun J Lambros N R Sottos |
| |
Institution: | (1) University of Illinois at Urbana–Champaign, Urbana, IL, USA |
| |
Abstract: | The digital image correlation (DIC) technique is successfully applied across multiple length scales through the generation
of a suitable speckle pattern at each size scale. For microscale measurements, a random speckle pattern of paint is created
with a fine point airbrush. Nanoscale displacement resolution is achieved with a speckle pattern formed by solution deposition
of fluorescent silica nanoparticles. When excited, the particles fluoresce and form a speckle pattern that can be imaged with
an optical microscope. Displacements are measured on the surface and on an interior plane of transparent polymer samples with
the different speckle patterns. Rigid body translation calibrations and uniaxial tension experiments establish a surface displacement
resolution of 1 μm over a 5×6 mm scale field of view for the airbrushed samples and 17 nm over a 100×100 μm scale field of
view for samples with the fluorescent nanoparticle speckle. To demonstrate the capabilities of the method, we characterize
the internal deformation fields generated around silica microspheres embedded in an elastomer under tensile loading. The DIC
technique enables measurement of complex deformation fields with nanoscale precision over relatively large areas, making it
of particular relevance to materials that possess multiple length scales. |
| |
Keywords: | Digital image correlation Nanoparticle Displacement measurement Multiscale Deformation |
本文献已被 SpringerLink 等数据库收录! |