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Influence of atomic force microscope AFM probe shape on adhesion force measured in humidity environment
作者姓名:阳丽  涂育松  谭惠丽
作者单位:[1]College of Physics Science and Technology, Guangxi Normal University, Guilin 541004, Guangxi Province, P. R. China [2]Institute of Systems Biology, Shanghai University, Shanghai 200444, P. R. China
基金项目:Project supported by the National Natural Science Foundation of China (Nos. 11105088 and 81060307), the Innovation Program of Shanghai Municipal Education Commission (No. 11YZ20), the Guangxi Natural Science Foundation Program (No. 2013GXNSFBA019006), and the Guangxi Province Higher Educational Science and Technology Program (No. 2013YB033)
摘    要:In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen- dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla- tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further under- standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

关 键 词:capillary  force    van  der  Waals  force    adhesion  force    curvatures  probe  shape  

Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment
Li Yang,Yu-song Tu,Hui-li Tan.Influence of atomic force microscope AFM probe shape on adhesion force measured in humidity environment[J].Applied Mathematics and Mechanics(English Edition),2014,35(5):567-574.
Authors:Li Yang  Yu-song Tu  Hui-li Tan
Institution:1. College of Physics Science and Technology, Guangxi Normal University, Guilin, 541004, Guangxi Province, P. R. China
2. Institute of Systems Biology, Shanghai University, Shanghai, 200444, P. R. China
Abstract:In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity dependence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correlation with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further understanding nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.
Keywords:capillary force  van der Waals force  adhesion force  curvatures probe shape
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