Exact static solutions to piezoelectric smart beams including peel stresses. II. Numerical results,comparison and discussion |
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| Institution: | 1. Department of Astronautic Science and Mechanics, Harbin Institute of Technology, Harbin 150001, China;2. Department of Mechanical Engineering and Science, Kyoto University, Kyoto 615-8540, Japan;3. Institute of Systems Engineering, China Academy of Engineering Physics, Mianyang 621900, China;1. Department of Engineering Mechanics, Zhejiang University, Hangzhou 310027, China;2. Soft Matter Research Center (SMRC), Zhejiang University, Hangzhou 310027, China;3. Department of Mathematics, City University of Hong Kong, Kowloon, Hong Kong, China;1. Department of Mechanical Engineering and Science, Kyoto University, Kyoto 615-8540, Japan;2. Key Laboratory of Pressure System and Safety, MOE, School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai 200237, China;3. Department of Astronautic Science and Mechanics, Harbin Institute of Technology, Harbin 150001, China |
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| Abstract: | This part presents the numerical results, comparisons and discussion for the exact static solutions of smart beams with piezoelectric (PZT) actuators and sensors including peel stresses presented in Part I. (International Journal of Solids and Structures, 39, 4677–4695) The actuated stress distributions in the adhesive and the adhesive edge stresses varying with the thickness ratios are firstly obtained and presented. The actuated internal stress resultants and displacements in the host beam are then calculated and compared with those predicted by using the shear lag model. The stresses in the adhesive caused by an applied axial force, bending moment and shear force are calculated, and then used to compute the sensing electric charges for comparison with those predicted using the shear lag model. The numerical results are given for the smart beam with (a) one bonded PZT and (b) two symmetrically bonded PZTs, with a comparison to those predicted using the shear lag model. Novel, simple and more accurate formulas for the equivalent force and bending moment induced by applied electric field are also derived for the host beam with one PZT or two symmetrically bonded PZTs. The symmetric shear stress and the anti-symmetric peel stress components caused by a shear force are discussed. In addition, in the case of PZT edge debonding, the stress redistribution in the adhesive and the self-arresting mechanism are also investigated. |
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