| 纳米级变形的扫描隧道显微镜测量研究 |
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| 引用本文： | 谢惠民,戴福隆,王欢,杨海强,高聚宁,庞世瑾.纳米级变形的扫描隧道显微镜测量研究[J].力学学报,1997,29(3):332-335. |
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| 作者姓名： | 谢惠民 戴福隆 王欢 杨海强 高聚宁 庞世瑾 |
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| 作者单位： | 清华大学工程力学系，100084 |
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| 基金项目： | 国家自然科学基金,中国科学院基金 |
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| 摘 要： | 提出了应用扫描隧道显微镜及利用物质原子结构测量纳米级变形的新方法，对高定向裂解石墨、单晶硅材料的纳米级变形进行了测量研究，得到了强激光辐照石墨的残余应变场，对拨原子后单晶硅形成的纳米裂纹附近区域的残余变形进行了分析
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| 关 键 词： | 扫描隧道显微镜 网格法 纳观变形 纳米级 |
THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE |
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| Xie Hui,min,Dai Fulong Wang Huan.THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE[J].chinese journal of theoretical and applied mechanics,1997,29(3):332-335. |
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| Authors: | Xie Hui min Dai Fulong Wang Huan |
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| Abstract: | By using the scanning tunneling microscope, a new method was put forw ard for measuring the nanometer-deformation with the atom structure. This measuring principle was used to measure the residual deformations of the irradiated single crystal graphite (HOPG) and the Si(111)7×7 surface after atom manipulation. The experimental results verify the present nanometer grid method for measuring nonometer-deformation. |
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| Keywords: | scanning tunneling microscope grid method nanometer-deformation |
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