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EFFECT OF SURFACE ENERGY ON DISLOCATION-INDUCED FIELD IN HALF-SPACE WITH APPLICATION TO THIN FILM-SUBSTRATE SYSTEMS
Authors:Ganyun Huang  Bob Svendsen Zhixing Lu
Institution:[1]Institute of Mechanics, Dortmund University of Technology, 44221 Dortmund, Germany [2]Sehool of Mechanical Engineering, Tianjin University, Tianjin 300072, China [3]Department of Mechanical Engineering, University of Colorado at Boulder, Colorado, USA
Abstract:In this work the elastic field of an edge dislocation in a half-space with the effect of surface energy has been obtained.The elastic field is then used to study the image force on the dislocation,the critical thickness for dislocation generation in epitaxial thin films with strain mismatch and the yielding strength of thin films on substrates.The results show that the image forces on the dislocation deviate from the conventional solutions when the distance of the dislocation from the free surface is smalle...
Keywords:thin film  surface energy effect  dislocation  half-space  critical thickness  yielding strength
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