HL-2M 装置宽谱段光谱诊断系统研制

HL-2M 装置宽谱段光谱诊断系统由采集光学、石英光纤和集成式光栅光谱仪构成，工作波段为 300~1100nm，可实现对工作气体(氢及其同位素)和内在杂质(碳、铁、氧等)线辐射的同步监测。通过将 5 台紧凑 型光谱仪并联形成集成式光栅光谱仪，可在保证宽谱段覆盖的同时实现较好的光谱分辨(0.04~0.19nm?pixel^?1)。目 前系统具有一个空间通道，最优时间分辨为 1.05ms，常规采样时间为 20ms。在 HL-2M 装置初始等离子体放电 实验期间，利用该套系统识别出氢等离子体的主要杂质为碳和氧，并对不同粒子的辐射特性进行了初步分析。

Development of HL-2M overview spectroscopy diagnostic system

HL-2M overview spectroscopy diagnostic system consisted of collection optics, optic fibers and  integrated spectrometer, and extended the observation wavelength range from standard visible band to near  infrared and near ultraviolet band. The overview spectrometer observes the wavelength range 300~1100 nm. The  spectral lines of working gas (hydrogen and its isotopes) and intrinsic impurities (carbon, iron, oxygen, et al.) can  be simultaneous monitored. The integrated spectrometer composed of five compact spectrometers ensured wide  wavelength coverage and good spectral resolution (0.04~0.19nm?pixel^?1). The system currently has one spatial  channel. The best time resolution was 1.05ms, and the system typically ran with a sampling time of 20ms. During  HL-2M first plasma experiments, the main impurities in the hydrogen plasmas were identified as carbon and  oxygen, and the characteristics of plasma emission were studied.