Lateral resolving power of a time-of-flight photoemission electron microscope期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

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Lateral resolving power of a time-of-flight photoemission electron microscope

Authors:	Email author" target="_blank">SA?Nepijko Email author A?Oelsner A?Krasyuk A?Gloskovskii NN?Sedov CM?Schneider G?Sch?nhense

Institution:	(1) Institute of Physics, University Mainz, Staudingerweg 7, 55099 Mainz, Germany;(2) Institute of Physics, National Academy of Sciences of Ukraine, pr. Nauki 46, 03650 Kiev, CIS, Ukraine;(3) The Moscow Military Institute, Golovachev str., 109380 Moscow, CIS, Russia;(4) Institute of Solid State and Materials Research Dresden, Helmholzstr. 20, 01069 Dresden, Germany

Abstract:	The lateral resolution of a time-of-flight photoemission electron microscope has been theoretically analyzed. It has been shown that the resolution limit can reach a few nanometers. The lateral resolution will be higher if the photoelectrons forming the image are characterized by a smaller acceptance angle obtained with the help of diaphragms in the crossover plane, a higher initial energy and a narrower interval of electron energies. The experimental results are in good agreement with the theoretical predictions. PACS 68.37.Xy

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