Microstructure and roughness improvement of polycrystalline Bi thin films upon pulsed-laser melting |
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Authors: | T Missana C N Afonso |
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Institution: | (1) Instituto de Optica, CSIC, C/Serrano, 121, E-28006 Madrid, Spain |
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Abstract: | Bismuth films with different thicknesses have been grown by do sputtering on substrates held at room temperature. The films are always formed by columnar crystals with a grain size comparable to the film thickness which lead to surface roughness. It increases with the thickness of the films and has a strong influence on the film optical properties. The films have been irradiated with nanosecond laser pulses, and real-time reflectivity measurements during the irradiation were used to follow the changes in the film optical properties. It will be shown that pulsed-laser irradiation of films thinner than 100 nm improves substantially their surface roughness and their crystalline quality by increasing the grain size at least one order of magnitude. |
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Keywords: | 81 40 68 55 |
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