New interferometric method for determining the refractive index of thin dielectric film,its thickness,the phase shift,and the order of interference |
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Authors: | N Barakat F F A El-Shazly H T El-Shair |
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Institution: | 1. Faculty of Science, Ain Shmas University, Cairo, ARE 2. Faculty of Education, Ain Shams University, Cairo, ARE
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Abstract: | A new interferometric method is proposed, using white light fringes of equal chromatic order to determine simultaneously the following paramcters: - The refractive index of a thin dielectric film, and hence its dispersion.
- The film thickness.
- The correct value of the order of interference.
- The phase shift occuring due to reflection at the dielectric/metal interface. In the present work, doubly silvered zinc sulphide (ZnS) thin dielectric film was used as an example in applying the proposed method.
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