Determination and analysis of the optical constants of thin films of nickel(II) and copper(II) hydrazone complexes by spectroscopic ellipsometry |
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Authors: | ZM Chen YQ Wu DH Gu FX Gan |
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Institution: | (1) Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, P.R. China;(2) Lab of Functional Materials, School of Chemistry and Materials Science, Heilongjiang University, Harbin, 150080, P.R. China |
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Abstract: | Thin films of four nickel(II) and copper(II) hydrazone complexes, which will hopefully be used as recording layers for the
next-generation of high-density recordable disks, were prepared by using the spin-coating method. Absorption spectra of the
thin films on K9 optical glass substrates in the 300–700 nm wavelength region were measured. Optical constants (complex refractive
indices N) and thickness d of the thin films prepared on single-crystal silicon substrates in the 275–675 nm wavelength region
were investigated on a rotating analyzer-polarizer scanning ellipsometer by fitting the measured ellipsometric angles (Ψ(λ)
and Δ(λ)) with a 3-layer model (Si/dye film/air). The dielectric functions ε and absorption coefficients α as a function of
the wavelength were then calculated. Additionally, a design to achieve high reflectivity and optimum dye film thickness with
an appropriate reflective layer was performed with the Film Wizard software using a multilayered model (PC substrate/reflective
layer/dye film/air) at 405 nm wavelength.
PACS 81.05.L; 78.20.Ci; 78.20.-e |
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Keywords: | |
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