Subject Index to Volume 33

This paper reports the investigation of microdroplet sample preparation for phosphate, strontium and rubidium using X-ray fluorescence. Sample filter papers were prepared by drying under several different conditions and the front and the back sides of the filter papers were measured using X-ray fluorescence (XRF), scanning electron microscopy (SEM), X-ray diffraction (XRD), and electron-probe microanalysis (EPMA).

It was reported by Murata and Murokado that the elemental distribution difference between the front and the back sides after drying the filter paper led to erratic data.¹ It has been found that the intensity difference between the front and the back sides was due to the condensation of the material of interest on the surface of the filter papers and the amount of the condensed material on the filter paper was related to the temperature at which the filter paper was dried.

Optimum temperature at which a filter paper is dried and an appropriate internal standard are essential to reproducible measurements.