| X光衍射中积分强度的近似公式 |
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| 引用本文： | 罗来龙.X光衍射中积分强度的近似公式[J].大学物理,2004,23(12):49-50. |
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| 作者姓名： | 罗来龙 |
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| 作者单位： | 武汉理工大学,理学院,湖北,武汉,430063 |
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| 摘 要： | 用X射线衍射仪做定量分析衍射实验时会因盖革记数器的死时间而出现漏计现象．为了简便地测定死时间，本文提出了单层膜两次照射技术，导出了校正积分强度的近似公式，并与逐次校正法作了对比分析。
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| 关 键 词： | X射线 衍射 死时间 积分强度 |
| 文章编号： | 1000-0712(2004)12-0049-02 |
| 修稿时间： | 2003年11月18 |
Approximate expression of integrated intensity in X-ray diffraction experiment |
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| LUO Lai-long.Approximate expression of integrated intensity in X-ray diffraction experiment[J].College Physics,2004,23(12):49-50. |
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| Authors: | LUO Lai-long |
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| Abstract: | In quantificational diffraction experiment by X-ray diffaction meter, dead time of Geiger counter result in metrical omitting. In order to measure the dead time, a method of twice irradiation on monolayer foil is proposed, and an approximate expression is given to proofread integrated intensity, this emendation is compared with point-by-point emendation. |
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| Keywords: | X-ray diffraction dead time integrated intensity |
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