Frequency modulated infrared imaging for thermal characterization of nanomaterials |
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| Institution: | 1. Department of Control and Information Systems Engineering, Tsuruoka National College of Technology, Sawada 104, Inooka, Tsuruoka 997-8511, Japan;2. Department of Materials Science and Engineering, Graduate School of Engineering, Tohoku University, Aramaki Aza Aoba, Sendai 980-0845, Japan;3. Semiconductor Research Institute of Semiconductor Research Foundation, Aramaki Aza Aoba 519-1176, Sendai 980-0845, Japan;1. Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Gansu, Lanzhou, 730000, China;2. School of Physical Electronics, University of Electronic Science and Technology of China, Sichuan, Chengdu, 610054, China;1. Department of Physics, Brown University Providence, RI, 02912, USA;2. School of Engineering, Brown University Providence, RI, 02912, USA;1. Department of Applied Physics, Hebei University of Technology, Tianjin 300401, China;2. Hebei Chemical and Pharmaceutical Vocational Technology College, Shijiazhuang 050026, China;3. Faculty of Science, Tianjin University, Tianjin 300072, China;4. College of Physics Science & Information Engineering, Hebei Normal University, Shijiazhuang 050024, China |
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| Abstract: | The paper presents frequency modulated thermal wave imaging (FMTWI) as a fast and efficient non-contact technique for in-plane thermal characterization of thin plate nanomaterials. A novel excitation signal in the form of an up-chirp is applied and the thermal response is monitored using an infrared (IR) thermography based temperature sensing system. The in-plane thermal diffusivity of any sample can be measured using the multiple phase information extracted from a single run of the experiment. This feature provides a time efficient approach for thermal measurements using infrared thermography techniques. The theoretical background and experimental details of the technique are discussed, with practical measurement of thermal diffusivity of an empty anodic alumina (AAO) template in direction perpendicular to the nanochannel axis, in support. |
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| Keywords: | Thermal diffusivity Infrared Thermography FMTWI |
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