首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Photoconductivity of Ge/Si quantum dot photodetectors
Authors:N Rappaport  E Finkman  P Boucaud  S Sauvage  T Brunhes  V Le Thanh  D Bouchier  S E Schacham  
Institution:

a Department of Electrical Engineering and Solid State Institute, Technion, Haifa 32000, Israel

b Institut d’Électronique Fondamentale UMR CNRS 8622, Université Paris XI, 91405, Orsay, France

c Department of Electrical and Electronic Engineering, College of Judea and Samaria, Ariel 44837, Israel

Abstract:Various structures of self-assembled Ge/Si quantum dot infrared photodetectors were implemented and investigated. The electronic structure of the QDIPs was studied by electrical and optical techniques including IV characteristics, dark current, photoconductivity, photoluminescence, and photo-induced infrared absorption. The photoconductive spectra consist of a broad multi-peak, composed of peaks ranging from 70 to 220 meV. Their relative intensity changes with bias. Comparative dark current measurements were performed. Dark current limits the performance of this first generation of Ge/Si QDIPs. It is plausible that direct doping in the dot layer is a viable way of reducing the dark current.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号