Thermal wave interference |
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Authors: | Andreas Gleiter Guenther Mayr |
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Institution: | 1. Nano-Science & Semiconductor Laboratories, Department of Physics, Faculty of Education, Ain Shams University, Cairo, Egypt;2. NCRRT, P.O. Box 8029, Nasr City, 11371 Cairo, Egypt;3. Materials Physics and Energy Laboratory, College of Sciences and Art at Ar Rass, Qassim University, Ar Rass 51921, Saudi Arabia |
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Abstract: | Thermal waves are used in nondestructive testing for defect analysis by lock-in-thermography. A thermal wave field contains useful information about material and component properties, such as layer thickness or reflection coefficients of internal boundaries. Only the exact knowledge of the thermal wave field enables quantitative evaluation of these parameters. For example, a calculated wave field can be used for deconvolution of lock-in-thermography images as it provides a point spread function and therefore gives a better lateral resolution. For a better knowledge of thermal wave fields, basic experiments concerning interference effects are presented in this paper. |
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