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Robust Low Voltage Program-Erasable Cobalt-Nanocrystal Memory Capacitors with Multistacked Al2O3/HfO2/Al2O3 Tunnel Barrier |
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| Authors: | LIAO Zhong-Wei GOU Hong-Yan HUANG Yue SUN Qing-Qing DING Shi-Jin ZHANG Wei ZHANG Shi-Li |
| Institution: | State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433School of Information and Communication, KTH (Royal Institute of Technology), Electrum 229, SE-164 40 Kista, Sweden |
| Abstract: | |
| Keywords: | 73 40 Qv 73 61 -r |
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