| Analysis of Local Structures around Ni Atoms Doped in ZnO-Based Diluted Magnetic Semiconductors by Fluorescence EXAFS |
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| 作者姓名： | 李斌斌 修向前 张荣 陶志阔 陈琳 谢自力 郑有炓 贺博 |
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| 作者单位： | [1]Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, Department of Physics, Nanjing University, Nanjing 210093 [2]National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026 |
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| 基金项目： | Supported by the Special Fund for Major State Basic Research Project of China under Grant No G2000068305, the National Natural Science Foundation of China under Grant 60390072, and the Natural Science Foundation of Jiangsu Province （BK2005210）. |
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| 摘 要： | Zn1-xNixO （x = 0.001, 0.01, 0.02, 0.05 and 0.20） powders are prepared by sol-gel method. An extended x-ray absorption fine structure technique （EXAFS） for the Ni K.edge is employed to probe the local structures around Ni atoms doped in ZnO powders by fluorescence mode. The near edge EXAFS of the samples does not change in the range of Ni concentration from x = 0.001 to 0.05, which is consistent with the results of x-ray diffraction of the samples. The simulation results for the first shell EXAFS signals indicated that Ni atoms are substituted in Zn sites.
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| 关 键 词： | 局部结构分析 镍原子 磁半导体 荧光性 EXAFS X射线 |
| 收稿时间： | 2005-12-13 |
| 修稿时间： | 2005-12-13 |
Analysis of Local Structures around Ni Atoms Doped in ZnO-Based Diluted Magnetic Semiconductors by Fluorescence EXAFS |
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| LI Bin-Bin, XIU Xiang-qian, ZHANG Rong, TAO Zhi-Kuo, CHEN Lin, XIE Zi-Li, ZHENG You-Dou, HE Bo.Analysis of Local Structures around Ni Atoms Doped in ZnO-Based Diluted Magnetic Semiconductors by Fluorescence EXAFS[J].Chinese Physics Letters,2006,23(4):907-910. |
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| Authors: | LI Bin-Bin XIU Xiang-qian ZHANG Rong TAO Zhi-Kuo CHEN Lin XIE Zi-Li ZHENG You-Dou HE Bo |
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