| A Reflected Terahertz-Emission Microscopy |
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| 作者姓名： | 杨玉平 严伟 汪力 |
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| 作者单位： | [1]Academy of Physics and Electronic Engineering, Central University for Nationalities, Beijing 100081 [2]Laboratory of Optical Physics, Institute of Physics and＇ Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080 |
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| 基金项目： | Supported by the National Natural Science Foundation of China under Grant Nos 10390160 and 39890390. This work was performed at the Research Centre for Superconductor Photonics, 0saka University, Japan. We acknowledge Masato Suzuki for his technical assistance. |
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| 摘 要： |
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| 关 键 词： | 反射能量 发射性能 显微镜 检查方法 物理学 |
| 修稿时间： | 2006-09-13 |
A Reflected Terahertz-Emission Microscopy |
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| YANG Yu-Ping,YAN Wei,WANG Li.A Reflected Terahertz-Emission Microscopy[J].Chinese Physics Letters,2007,24(1):169-171. |
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| Authors: | YANG Yu-Ping YAN Wei WANG Li |
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| Institution: | Academy of Physics and Electronic Engineering, Central University for Nationalities, Beijing 100081
Laboratory of Optical Physics, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080 |
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| Abstract: | A novel reflected terahertz-emission microscopy is proposed and developed for improving the spatial resolution of THz imaging. When attaching a bow-tie antenna directly onto a thin generation crystal, the reflected THz waves can be collected and detected by a photoconductive antenna, and the spatial resolution is decided by the diameter of focused pump beam. In this way, the detected resolution can be largely improved and tunable. The configuration and characteristics of this microscopy are described in detail. |
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| Keywords: | 68 37 Vj 68 37 Uv 95 85 Gn |
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