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Double Electron Processes in Collisions of Partially Stripped Ions C^q+ (q = 1-4) with Helium
引用本文:丁宝卫,陈熙萌,于得洋,付宏斌,刘兆远,孙光智,刘玉文,鲁彦霞,谢江山,杜鹃,高志民,陈林,崔莹,邵剑雄,何子峰,蔡晓红.Double Electron Processes in Collisions of Partially Stripped Ions C^q+ (q = 1-4) with Helium[J].中国物理快报,2007,24(1):94-96.
作者姓名:丁宝卫  陈熙萌  于得洋  付宏斌  刘兆远  孙光智  刘玉文  鲁彦霞  谢江山  杜鹃  高志民  陈林  崔莹  邵剑雄  何子峰  蔡晓红
作者单位:[1]School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000 [2]Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000
基金项目:Supported by the National Natural Science Foundation of China with Grant No 10304019.
摘    要:The multi-electron processes are investigated for 17.9-120 keV/u C^1+, 30-323 keV/u C^2+, 120-438 keV/u ^C3+, 287-480 keV/u C^4+ incident on a helium target. The cross-section ratios of double electron (DE) process to the total of the single electron (SE) and the double electron process (i.e. SE+DE), the direct double electron (DDI) to the direct single ionization (DSI) as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed.

关 键 词:双重工艺  碰撞实验  C^q+  (q  =  1-4)  氦元素
修稿时间:2006-10-16

Double Electron Processes in Collisions of Partially Stripped Ions Cq+(q=1-4) with Helium
DING Bao-Wei,CHEN Xi-Meng,YU De-Yang,FU Hong-Bin,LIU Zhao-Yuan,SUN Guang-Zhi,LIU Yu-Wen,LU Yan-Xia,XIE Jiang-Shan,DU Juan,GAO Zhi-Min,CHEN Lin,CUI Ying,SHAO Jian-Xiong,HE Zi-Feng,CAI Xiao-Hong.Double Electron Processes in Collisions of Partially Stripped Ions Cq+(q=1-4) with Helium[J].Chinese Physics Letters,2007,24(1):94-96.
Authors:DING Bao-Wei  CHEN Xi-Meng  YU De-Yang  FU Hong-Bin  LIU Zhao-Yuan  SUN Guang-Zhi  LIU Yu-Wen  LU Yan-Xia  XIE Jiang-Shan  DU Juan  GAO Zhi-Min  CHEN Lin  CUI Ying  SHAO Jian-Xiong  HE Zi-Feng  CAI Xiao-Hong
Institution:School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000
Abstract:The multi-electron processes are investigated for 17.9--120keV/u C1+, 30--323keV/u C2+, 120--438keV/u C3+, 287--480keV/u C4+ incident on a helium target. The cross-section ratios of double electron (DE) process to the total of the single electron (SE) and the double electron process (i.e. SE+DE), the direct double electron (DDI) to the direct single ionization (DSI) as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed.
Keywords:34  70  +e  34  50  Fa
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