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Oxygen Pressure Dependence of Properties of Epitaxial LaAlO3 Films Grown on Si (100)
引用本文:相文峰,吕惠宾,陈正豪,何萌,周岳亮.Oxygen Pressure Dependence of Properties of Epitaxial LaAlO3 Films Grown on Si (100)[J].中国物理快报,2005,22(6):1515-1517.
作者姓名:相文峰  吕惠宾  陈正豪  何萌  周岳亮
作者单位:BeijingNationalLaboratoryforCondensedMatterPhysics,InstituteofPhysics,ChineseAcademyofSciences,Beijing100080
摘    要:Heteroepitaxial LaAlO3 films were grown on a SrTiO3/Si (100) substrate by laser molecular beam epitaxy under different oxygen pressures, and their properties such as crystallinity and electrical characteristics were experimentally investigated using the various measurement methods. The results show that most properties depend mainly on the deposition oxygen pressure. The crystallinity and the C-V and I-V characteristics can be greatly improved with the increasing oxygen deposition pressure. Moreover, after annealed at 1050~C in N2 ambient, the C-V and I-V characteristics of LAO films deposited at the lower oxygen pressure are also improved due to the decrease of oxygen vacancies in LAO films.

关 键 词:铝酸镧  薄膜外延  生长工艺  硅基  氧化压力
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