| Simplified Model for Analysing Ion/Photoelectron Images |
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| 作者姓名： | 朱井义 王丙星 郭玮 王艳秋 王利 |
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| 作者单位： | [1]State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Dalian 116023 [2]Graduate School of the Chinese Academy of Sciences, BeijinglO0039 |
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| 基金项目： | Supported by the National Natural Science Foundation of China under Grant Nos 20633070 and 20473090. |
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| 摘 要： | Based on the Onion-Peeling algorithm （OPA） principle, we present a simplified model for analysing photoion and photoelectron images, which allows the analysis of experimental raw images. A three-dimensional distribution of the nascent charged particles, from which the radial and angular distributions are deduced, can be obtained more easily by this model than by the commonly used procedures. The analysis results of Xe photoelectron images by this model are compared with those from the standard Hankel-Abel inversion. The results imply that this model can be used for complicated （many peaks） and ＇ditffcult＇ （low signal-to-noise） images with cylindrical symmetries, and can provide a reliable reconstruction in some cases when the commonly used Haukel Abel transform method fails.
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| 关 键 词： | 离子 光电子 成像技术 模型 |
| 收稿时间： | 2007-3-15 |
| 修稿时间： | 2007-03-15 |
Simplified Model for Analysing Ion/Photoelectron Images |
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| ZHU Jing-Yi,WANG Bing-Xing,GUO Wei,WANG Yan-Qiu,WANG Li.Simplified Model for Analysing Ion/Photoelectron Images[J].Chinese Physics Letters,2007,24(7):1922-1925. |
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| Authors: | ZHU Jing-Yi WANG Bing-Xing GUO Wei WANG Yan-Qiu WANG Li |
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| Institution: | State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Dalian 116023Graduate School of the Chinese Academy of Sciences, Beijing100039 |
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| Abstract: | Based on the Onion--Peeling algorithm (OPA) principle, we present a simplified model for analysing photoion and photoelectron images, which allows the analysis of experimental raw images. A three-dimensional distribution of the nascent charged particles, from which the radial and angular distributions are deduced, can be obtained more easily by this model than by the commonly used procedures. The analysis results of Xe photoelectron images by this model are compared with those from the standard Hankel--Abel inversion. The results imply that this model can be used for complicated (many peaks) and `difficult' (low signal-to-noise) images with cylindrical symmetries, and can provide a reliable reconstruction in some cases when the commonly used Hankel Abel transform method fails. |
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| Keywords: | 39 90 +d 32 80 Rm |
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