Single-shot multiple-delay crossed-beam spectral interferometry for measuring extremely complex pulses

We demonstrate a single-shot measurement technique based on spectral interferometry (SI) for measuring the complete intensity and phase vs. time of extremely complex ultrashort laser pulses. Ordinarily, such a method would require an extremely-high-resolution spectrometer, but, by temporally interleaving many SI measurements, each using a different reference-pulse delay, our method overcomes this need. It involves introducing a transverse time delay into the reference pulse by tilting its pulse front transversely to the spectrometer dispersion plane. The tilted reference pulse then gates the unknown pulse by interfering with it at the image plane of a low-resolution imaging spectrometer, yielding an effective increase in the delay range and spectral resolution—by a factor of 30 in our proof-of-principle implementation. Our device achieved a temporal resolution of ~ 130 fs and a temporal range of 120 ps. This simple device has the potential to measure even longer and more complex pulses.