Design of guided-mode resonance filters with an antireflective surface at oblique incidence |
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| Authors: | Tian Sang Hua Zhao Shaohong Cai Zhanshan Wang |
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| Institution: | 1. Department of Physics and Electronic Science, Qiannan Normal College for Nationalities, Duyun 558000, People''s Republic of China;2. Guizhou Key Laboratory of Economic System Simulation, Guizhou University of Finance and Economics, Guiyang 550004, People''s Republic of China;3. Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, People''s Republic of China;1. Key Lab of Opto-electronic Information Acquisition and Manipulation, Ministry of Education, Anhui University, Hefei 230039, PR China;2. Department of Physics, Anhui Medical University, Hefei 230032, PR China;1. Department of Laser and Optical Engineering, University of Bonab, Bonab, Iran;2. Faculty of Physics, University of Tabriz, Tabriz, Iran;1. Electronics & Information College, Hangzhou Dianzi University, Hangzhou 310018, China;2. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China;1. Department of Mechanical Engineering and Advanced Institute of Manufacturing with High-Tech Innovations, National Chung Cheng University, Chiayi, Taiwan;2. Department of Chemistry and Biochemistry, National Chung Cheng University, Chiayi, Taiwan;3. Department of Chemistry and Center for Nanoscience and Nanotechnology, National Sun Yat-sen University, Kaohsiung, Taiwan;4. School of Pharmacy, College of Pharmacy, Kaohsiung Medical University, Kaohsiung, Taiwan;5. Center for Stem Cell Research, Kaohsiung Medical University, Kaohsiung, Taiwan |
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| Abstract: | A design approach of guided-mode resonance filter (GMRF) with an antireflective surface at oblique incidence is presented. For a given incident angle or grating filling factor, the required grating filling factor or incident angle can be expressed by the analytical forms of the quadratic equations at quarter-wavelength thickness. Long-range, low sidebands are obtainable for a single-layer GMRF under the TM mode wave illumination at oblique incidence. The reflection properties such as the symmetry of the lineshape and the sideband level in the logarithm scale can be further improved by slightly varying both the grating period and the grating thickness. Magnetic field enhancement occurs in these structures due to the coupling between the evanescent diffracted order and the waveguide mode. |
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