| Abstract: | In this paper the directional hemispherical reflectivity and transmissivity of one-dimensional, randomly rough, dielectric surfaces are determined by the use of the integral method. This method is derived from electromagnetic theory without any restrictive hypotheses. Since this exact approach is computationally very intensive, a geometric optics approximation method is also developed. Curves displaying radiative properties versus the correlation length for a constant mean square deviation of the surface from flatness are presented. In this respect, the influence on the validity of the approximate method of multiple scattering, the shadowing effect and the real index of refraction of the dielectric have been investigated. Transverse electric and transverse magnetic polarized incident plane waves are considered. For the latter, our interest is focused on the influence of roughness on the reflected and transmitted intensities for an angle of incidence close to the Brewster angle. |
