| 纳米结构电学性质的静电力显微镜研究方法 |
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| 引用本文： | 张冬冬,王锐,蒋烨平,戚桂村,王琛,裘晓辉.纳米结构电学性质的静电力显微镜研究方法[J].物理,2011,40(9):573-579. |
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| 作者姓名： | 张冬冬 王锐 蒋烨平 戚桂村 王琛 裘晓辉 |
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| 作者单位： | 国家纳米科学中心纳米表征研究室,北京,100190 |
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| 基金项目： | 国家重点基础研究发展计划(批准号:2007CB936802); 国家自然科学基金(批准号:20973046)资助项目 |
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| 摘 要： | 纳米尺度的材料具有许多不同于宏观体材料的奇特的物理和化学特性.了解纳米结构的物性随材料尺寸及形状的变化关系,对于设计和合成具有特定功能的纳米材料有重要的指导意义.静电力显微镜技术为研究微纳米尺度下材料的电学特性提供了强有力的工具.文章介绍了这种测量技术的基本原理,并列举了几种在静电力显微镜基础上发展起来的纳米材料电学性...
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| 关 键 词： | 静电力显微镜 针尖特征电容 介电常数 表面电荷密度 载流子密度 |
Electrical characterization of nanostructured materials using electric force microscopy |
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| G Dong-Dong,G Rui,G Ye-Ping,I Gui-Cun,G Chen,IU Xiao-Hui.Electrical characterization of nanostructured materials using electric force microscopy[J].Physics,2011,40(9):573-579. |
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| Authors: | G Dong-Dong G Rui G Ye-Ping I Gui-Cun G Chen IU Xiao-Hui |
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| Institution: | (National Center for Nanoscience and Technology,Laboratory for Nanocharacterization,Beijing 100190,China) |
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| Abstract: | Nanostructured materials possess interesting physical and chemical properties which may differ significantly from their macroscopic counterparts.Understanding the size and shape dependence of nanostructures is important to the rational design of nanomaterials with a desired functionality.Scanning probe microscopy and its derivatives provide unique opportunities to deepen our insight into the electrical characteristics of nanostructures.We have developed several new approaches based on electric force microsc... |
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| Keywords: | electric force microscopy characteristic capacitance permittivity surface charge density carrier density |
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