| Institution: | 1. Department of Electronics and Communication Engineering, National Institute of Technology (NIT) , Tiruchirappalli 620015, India;2. Department of Electrical, Electronic & Computer Engineering, University of Pretoria, South Africa;1. College of Information & Communication Engineering, Harbin Engineering University, Harbin, China;2. Remote Sensing Signal and Image Processing Laboratory, Department of Computer Science and Electrical Engineering, University of Maryland, Baltimore County, Baltimore, MD 21250, USA;3. Center for Excellence in Signal and Image Processing, Department of Electronics and Electrical Engineering, University of Strathclyde, Glasgow G1 1XW, UK;1. Department of Applied Optics and Photonics, Calcutta University, 92, A.P.C. Road, Kolkata 700 009, India;2. Department of Electronics & Communication Engineering, B. P. Poddar Institute of Management & Technology, 137, VIP Road, Kolkata 700052, India;1. State Key Laboratory of Integrated Service Networks, School of Telecommunications Engineering, Xidian University, Xi’an 710071, China;2. School of Physics and Optoelectronic Engineering, Xidian University, Xi’an 710071, China;3. Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi’an 710071, China;1. Department of Electronic Engineering, Howard College, University of KwaZulu-Natal, Durban 4041, South Africa;2. Department of Computer Systems Engineering, Tshwane University of Technology, Pretoria 0001, South Africa;1. School of Electronics and Telecommunications, Hanoi University of Science and Technology, 405/C9, No. 1, Dai Co Viet Street, Hanoi 10000, Viet Nam;2. Computer Communications Lab, The University of Aizu, Tsuruga, Ikki-machi, Aizu-Wakamatsu shi, Fukushima-ken 965-8580, Japan |
