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Polarization detection with polarization interference imaging spectrometer |
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| Authors: | Xiaohua Jian Chunmin Zhang Baochang Zhao |
| Institution: | a School of Science, Xi’an Jiao Tong University, Xi’an 710049, PR China b Non-equilibrium Condensed Matter and Quantum Engineering Laboratory, The Key Laboratory of Ministry of Education, Xi’an 710049, PR China c Xi’an Institute of Optics and Precision Mechanics, Academia Sinica, Xi’an 710068, PR China |
| Abstract: | A new method of measuring the intensity and state of polarization of optical radiation by means of the high resolution polarization interference imaging spectrometer (PIIS) is introduced and theoretically investigated in this paper. The error accuracy analysis is proposed, and it is proved that the system is very stable and precise in theory. In this new way, the polarized characteristics of light could be taken good use to analyze and distinguish objects in passive remote sensing with the PIIS, which means that the polarization interference imaging spectrometer now can be used not only as cameras and interferometers but also as polaristrobometers. |
| Keywords: | Polarization detection Polarization interference imaging spectrometer Stokes vectors |
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