Optical Tamm mode based refractometer in all-dielectric configuration |
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| Institution: | 1. Universidad San Buenaventura Cali Facultad de Ingeniería, A.A. 25162 Cali, Colombia;2. Universidad del Valle, Departamento de Física, A.A. 25360 Cali, Colombia;1. State Key Laboratory for Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China;2. Collaborative Innovation Center of Quantum Matter, Beijing, China;1. Graduate School of Life Science, Hokkaido University, Sapporo 060-0810, Japan;2. Faculty of Advanced Life Science, Hokkaido University, Sapporo 060-0810, Japan;1. Department of Applied Physics, National Pingtung University, Pingtung 900, Taiwan;2. Graduate Institute of Electro-Optical Engineering, Chang Gung University, Tao-Yuan 333, Taiwan;3. Institute of Electro-Optical Science and Technology, National Taiwan Normal University, Taipei 116, Taiwan;1. School of Micro-Nano Electronics, State Key Laboratory of Silicon Materials, and ZJU-UIUC Joint Institute, Zhejiang University, Hangzhou 310027, China;2. School of Energy Science and Engineering, Harbin Institute of Technology, Harbin 150001, China;3. Département de Physique, Faculté Des Sciences (FDS), Université de Lomé, 01BP 1515 Lomé, Togo;4. Institut Supérieur de Technologie, Université de Bangui, BP 892 Bangui, the Central African Republic |
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| Abstract: | Optical Tamm (OT) modes formed at the interface of distributed-Bragg reflector (DBR) and low-index dielectric material, exhibit strong dispersive features at optical frequencies which gives rise to the possibility of designing refractometer with improved sensitivity. Using this idea, we design a TiO2/SiO2 based DBR configuration for sensing refractive-index changes around 1.33 using spectral-interrogation as well as angular-interrogation method. Dispersion characteristics of OT modes in the DBR configuration are tailored to obtain spectral sensitivity ∼1200 nm/RIU and angular sensitivity ∼40°/RIU for both transverse-electric (TE) and transverse-magnetic (TM) polarizations. We also show that the sensitivity could be substantially tuned over a wide range by appropriately choosing the thicknesses of DBR constituent layer. An all-dielectric DBR configuration gives rise to the possibility of realizing refractometer in any desired spectral region by linearly translating the dispersive behavior of photonic bandgap (PBG) guided OT modes. |
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| Keywords: | Photonic bandgap Surface mode Refractive index Dispersion |
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