| A study on the short—wavelength and high—numerical—aperture phase—change recording |
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| 引用本文： | 刘 波,阮 昊,干福熹.A study on the short—wavelength and high—numerical—aperture phase—change recording[J].中国物理 B,2003,12(1):107-111. |
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| 作者姓名： | 刘 波 阮 昊 干福熹 |
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| 作者单位： | (1)Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China; (2)Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201801, China; (3)Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201802, China |
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| 基金项目： | Project supported by the Foundation of the Shanghai Applied Physics Centre, and the National Natural Science Foundation of China (Grant No 59832060). |
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| 摘 要： | In this paper, we discuss the phase-change recording at a short-wavelength (514nm) and a high numerical aperture (0.85). Effects
of recording power and pulse width on the size of the recording
marks are studied. The minimum recording mark with a length of
approximately 220nm has been observed. The capacity of about 17GB
for a single-layer disc of a 12cm diameter can be obtained. The
maximum carrier-to-noise ratio reaches 45dB at a writing power of 13--14mW.
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| 关 键 词： | 相变存储 传输电子显微照片 短波长 高数值孔径 |
| 收稿时间： | 2002-05-29 |
A study on the short-wavelength and high-numerical-aperture phase-change recording |
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| Liu Bo,Ruan Hao and Gan Fu-Xi.A study on the short-wavelength and high-numerical-aperture phase-change recording[J].Chinese Physics B,2003,12(1):107-111. |
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| Authors: | Liu Bo Ruan Hao and Gan Fu-Xi |
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| Institution: | Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China |
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| Abstract: | In this paper, we discuss the phase-change recording at a short-wavelength (514nm) and a high numerical aperture (0.85). Effects
of recording power and pulse width on the size of the recording
marks are studied. The minimum recording mark with a length of
approximately 220nm has been observed. The capacity of about 17GB
for a single-layer disc of a 12cm diameter can be obtained. The
maximum carrier-to-noise ratio reaches 45dB at a writing power of 13--14mW. |
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| Keywords: | phase-change short-wavelength high numerical aperture transmission--electron microscopy |
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