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Research on CeO2 cap layer for YBCO-coated conductor
作者姓名:石东奇  马平  KoRock-Kil  KimHo-Sup  ChungJun-Ki  SongKyu-Jeong  ParkChan
作者单位:Institute for Superconducting and Electronic Materials, University of Wollongong, Australia;State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China;Korea Electrotechnology Research Institute, Changwon,Kyungnam,Korea;Korea Electrotechnology Research Institute, Changwon,Kyungnam,Korea;Korea Electrotechnology Research Institute, Changwon,Kyungnam,Korea;Korea Electrotechnology Research Institute, Changwon,Kyungnam,Korea;School of Materials Science {& Engineering, College of Engineering, Seoul National University, Seoul 151-744, Korea
基金项目:Project supported by the 21st Century Frontier R{\&}D Program of the Center for Applied Superconductivity Technology, funded by the Ministry of Science and Technology, Republic of Korea.
摘    要:Two groups of coated conductor samples with different thicknesses of CeO2 cap layers deposited by pulsed laser deposition (PLD) under the same conditions have been studied. Of them, one group is of CeO2 films, which are deposited on stainless steel (SS) tapes coated by IBAD-YSZ (IBAD-YSZ/SS), and the other group is of CeO2/YSZ/Y2O3 multilayers, which are deposited on NiW substrates by PLD for the fabrication of YBCO-coated conductor through the RABiTS approach. YBCO film is then deposited on the tops of both types of buffer layers by PLD. The effects of the thickness of the CeO2 film on the texture of the CeO2 film and the critical current density (Jc) of the YBCO film are analysed. For the case of CeO2 film on IBAD-YSZ/SS, there appears a self-epitaxy effect with increasing thickness of the CeO2 film. For CeO2/YSZ/Y2O3/NiW, in which the buffer layers are deposited by PLD, there occurs no self-epitaxy effect, and the optimal thickness of CeO2 is about 50 nm. The surface morphologies of the two groups of samples are examined by SEM.

关 键 词:导体  缓冲器  外延物质  铈元素
修稿时间:2006-10-102007-01-31

Research on CeO2 cap layer for YBCO-coated conductor
Shi Dong-Qi,Ma Ping,Ko Rock-Kil,Kim Ho-Sup,Chung Jun-Ki,Song Kyu-Jeongc and Park Chan.Research on CeO2 cap layer for YBCO-coated conductor[J].Chinese Physics B,2007,16(7):2142-2147.
Authors:Shi Dong-Qi  Ma Ping  Ko Rock-Kil  Kim Ho-Sup  Chung Jun-Ki  Song Kyu-Jeongc and Park Chan
Abstract:Two groups of coated conductor samples with different thicknesses of CeO2 cap layers deposited by pulsed laser deposition (PLD) under the same conditions have been studied. Of them, one group is of CeO2 films, which are deposited on stainless steel (SS) tapes coated by IBAD-YSZ (IBAD-YSZ/SS), and the other group is of CeO2/YSZ/Y2O3 multi-layers, which are deposited on NiW substrates by PLD for the fabrication of YBCO-coated conductor through the RABiTS approach. YBCO film is then deposited on the tops of both types of buffer layers by PLD. The effects of the thickness of the CeO$_{2}$ film on the texture of the CeO2 film and the critical current density (Jc) of the YBCO film are analysed. For the case of CeO2 film on IBAD-YSZ/SS, there appears a self-epitaxy effect with increasing thickness of the CeO2 film. For CeO2/YSZ/Y2O3/NiW, in which the buffer layers are deposited by PLD, there occurs no self-epitaxy effect, and the optimal thickness of CeO2 is about 50nm. The surface morphologies of the two groups of samples are examined by SEM.
Keywords:coated conductor  buffer layer  self-epitaxy  CeO2
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