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The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode
作者姓名:徐春凯  魏征  陈向军  徐克尊
作者单位:Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China;Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China;Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China;Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China
基金项目:Project supported by the National Natural Science Foundation of China (No 10404026) and the Specialized Research Fund for the Doctoral Program of Higher Education (No 20020358008).
摘    要:In this paper single ultra-fast voltage pulses are introduced to the Pt/Ir tip of a scanning tunnelling microscope (STM), and the non-destructive threshold of the graphite surface is studied systematically in a wide range of pulse durations (from 104 to 8 ns). Considering the waveform distortion of the pulses at the tunnelling region, this paper gives the corrected threshold curve of pulse amplitude depending on pulse duration. A new explanation of threshold power has been suggested and fits the experimental results well.

关 键 词:非破坏阈值  电压脉冲  隧道效应  超快速脉冲模式
收稿时间:2006-09-14
修稿时间:2006-09-14

The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode
Xu Chun-Kai,Wei Zheng,Chen Xiang-Jun and Xu Ke-Zun.The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode[J].Chinese Physics B,2007,16(8):2315-2318.
Authors:Xu Chun-Kai  Wei Zheng  Chen Xiang-Jun and Xu Ke-Zun
Institution:Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics University of Science and Technology of China, Hefei, Anhui 230026, China
Abstract:In this paper single ultra-fast voltage pulses are introduced to the Pt/Ir tip of a scanning tunnelling microscope (STM), and the non-destructive threshold of the graphite surface is studied systematically in a wide range of pulse durations (from 10$^{4}$ to 8\,ns). Considering the waveform distortion of the pulses at the tunnelling region, this paper gives the corrected threshold curve of pulse amplitude depending on pulse duration. A new explanation of threshold power has been suggested and fits the experimental results well.
Keywords:non-destructive threshold  voltage pulse  scanning tunnelling microscope
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