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α-Si1-xCx:H薄膜材料的弹性反冲探测分析
引用本文:周平,路秀琴,郭继宇,赵葵,吴伟明,隋丽,倪嵋楠,梅俊平,罗红兵,刘建成.α-Si1-xCx:H薄膜材料的弹性反冲探测分析[J].原子核物理评论,2004,21(3):249-252.
作者姓名:周平  路秀琴  郭继宇  赵葵  吴伟明  隋丽  倪嵋楠  梅俊平  罗红兵  刘建成
作者单位:[1]中国原子能科学研究院核物理所,北京102413[2]广西大学物理科学与工程技术学院。广西南宁530004
基金项目:国际原子能机构(IAEA)支持的国际合作项目(CPR-11314)
摘    要:介绍在中国原子能科学研究院HI-13串列加速器上,对α-Si1-xCx:H薄膜样品进行弹性反冲探测分析的方法和结果.用该加速器提供的高品质^127Ⅰ束流轰击α-Si1-xCx:H薄膜材料样品,用△E(gas)一E(PSD)望远镜探测器,在前角区(30。角)测量从该样品中反冲的各元素的能谱.然后用离子束分析(IBA)程序SIMNRA对能谱进行拟合,得到样品中H,C和Si的比分及深度分布.Elastic recoil detection analysis of α-Si_(1-x)C_(x)∶H foils has been performed at the HI-13 tandem accelerator of CIAE. High quality~(127)I beam bombards the target of α -Si_(1-x)C_(x)∶H_( ) thin film. A ΔE(gas)-(E(PSD)) telescope was used to measure the energy spectra of all elements recoiled from the samples at the angle of 30° in laboratory system. Components of H, C and Si and the profiles were obtained by simulation of the energy spectra using the program SIMNRA calculation.

关 键 词:非晶氢化硅碳薄膜    弹性反冲探测分析    能隙宽度    △E-E望远镜探测器    能谱拟合
文章编号:1007-4627(2004)03-0249-04
收稿时间:1900-01-01
修稿时间:2003年12月19

Elastic Recoil Detection Analysis of α-Si1-xCx:H Thin Films
Institution:(1 China Institute of Atomic Energy; Beijing 102413; China;2 Department of Physics; Guangxi University; Nanning 530004; Guangxi; China);
Abstract:Elastic recoil detection analysis of α-Si_(1-x)C_(x)∶H foils has been performed at the HI-13 tandem accelerator of CIAE. High quality~(127)I beam bombards the target of α -Si_(1-x)C_(x)∶H_( ) thin film. A ΔE(gas)-(E(PSD)) telescope was used to measure the energy spectra of all elements recoiled from the samples at the angle of 30° in laboratory system. Components of H, C and Si and the profiles were obtained by simulation of the energy spectra using the program SIMNRA calculation.
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