| THGEM探测器X光斑寻迹和位置分辨实验研究 |
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| 引用本文： | 刘川凤,周晓娟,周健荣,鲁黎明,朱林,何聪,谭莹莹,许虹,谢宇广,王晓冬,吴金杰,陈元柏,孙志嘉.THGEM探测器X光斑寻迹和位置分辨实验研究[J].原子核物理评论,2018,35(1):61-65. |
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| 作者姓名： | 刘川凤 周晓娟 周健荣 鲁黎明 朱林 何聪 谭莹莹 许虹 谢宇广 王晓冬 吴金杰 陈元柏 孙志嘉 |
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| 作者单位： | 1.中国科学院高能物理研究所, 北京 100049; |
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| 基金项目： | 国家重点研发计划项目（2017YFA0403702）；国家自然科学基金资助项目（11635012，11775243）；广东省引进创新创业团队资助项目（2016ZT06G025）；中国科学院科研装备研制项目（YZ201512） |
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| 摘 要： | 介绍了一种基于THGEM的X射线光斑寻迹探测器，用于X射线单光子计量技术研究和测量，探测器有效面积200 mm×200 mm，采用128路基于ASIC和FPGA的高速读出电子学，探测器分为中间高分辨区和外围低分辨区两部分，两部分共用一套读出电子学。实验在中国计量科学研究院利用X光机产生的束线，测试光斑位置、光斑精细分布以及探测器的位置分辨。实验结果表明，探测器实现了同时对光斑寻迹和光斑的精细测量，探测器中间高分辨区x方向的位置分辨率为0.63 mm（FWHM），y方向位置分辨率为0.62mm（FWHM），探测器各项性能指标均达到了预期目标。This paper introduces the detector of X-ray spot tracing based on the THGEM. It is used for X ray single photon measurement technology research and measurement with an effective area of 200 mm×200 mm. The circuit board has 128 array of high speed readout electronics based on ASIC and FPGA. And it is divided into two parts:the middle area of high sensitive and the peripheral area of low sensitive. The two parts share a set of readout electronics. The experiment tests the position and the fine structure of the beam line produced by X ray machine in National Institute of Metrology. The results of the experimental show that the detector realizes both the spot tracing and the fine structure of the spot. The position resolution is 0.63 mm in x direction and 0.62 mm in y direction in high sensitive of the detector, which achieve the desired goal of preliminary design.
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| 关 键 词： | THGEM探测器 位置分辨 光斑精细测量 光斑寻迹 |
| 收稿时间： | 2017-11-27 |
Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector |
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| LIU Chuanfeng,ZHOU Xiaojuan,ZHOU Jianrong,LU Liming,ZHU Lin,HE Cong,TAN Yingying,XU Hong,XIE Yuguang,WANG Xiaodong,WU Jinjie,CHEN Yuanbo,SUN Zhijia.Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector[J].Nuclear Physics Review,2018,35(1):61-65. |
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| Authors: | LIU Chuanfeng ZHOU Xiaojuan ZHOU Jianrong LU Liming ZHU Lin HE Cong TAN Yingying XU Hong XIE Yuguang WANG Xiaodong WU Jinjie CHEN Yuanbo SUN Zhijia |
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| Institution: | 1.Institute of High Energy Physics Chinese Academy of Sciences, Beijing 10049, China;2.Centre of Excellence for Advanced Materials, Dongguan 523808, Guangdong, China;3.Dongguan Neutron Science Center, Dongguan 523803, Guangdong, China;4.State Key Laboratory of Particle Detection and Electronics, Beijing 100049, China;5.School of Nuclear Science and Technology, University of South China, Hengyang 421000, Hunan, China;6.National Institute of Metrology, Beijing 100029, China |
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| Abstract: | This paper introduces the detector of X-ray spot tracing based on the THGEM. It is used for X ray single photon measurement technology research and measurement with an effective area of 200 mm×200 mm. The circuit board has 128 array of high speed readout electronics based on ASIC and FPGA. And it is divided into two parts:the middle area of high sensitive and the peripheral area of low sensitive. The two parts share a set of readout electronics. The experiment tests the position and the fine structure of the beam line produced by X ray machine in National Institute of Metrology. The results of the experimental show that the detector realizes both the spot tracing and the fine structure of the spot. The position resolution is 0.63 mm in x direction and 0.62 mm in y direction in high sensitive of the detector, which achieve the desired goal of preliminary design. |
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| Keywords: | THGEM detector position resolution spot structure spot tracing |
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