Theory of the resonance escape factors of plasma resonance lines basing on the exact Voigt profile

In this paper, based on the exact Voigt profile we obtained, we derive the theory of resonance escape factors of plasma resonance lines, for both Lorentzian profile and Voigt profile. The oscillator strength, the number density of the absorbing atoms in the ground state, and the optical depth in the line center are discussed. As an example, the helium He I 1083.0 nm, lithium Li I 670.970 nm and carbon C I 111.74 nm are discussed for infrared, visible and ultraviolet regions. The results we calculated are in good agreement with the experimental results. These calculations will be significant in the theoretical analysis of plasma.